Instituto Superior Técnico, Department of Electrical and Computer Engineering, University of Lisbon and Instituto de Telecomunicações, Av. Rovisco Pais, 11049-001 Lisbon, Portugal.
Received on 20 April 2023; revised on 30 May 2023; accepted on 02 June 2023
The recommended random noise test for analogue to digital converters (ADCs), as stated in the IEEE 1057 Standard for Digitizing Waveform Recorders, suggests the utilization of a triangular signal as the stimulus for the ADC under examination. However, we will demonstrate that an alternative option of employing a sinusoidal stimulus signal is equally feasible. This substitution provides enhanced flexibility during the testing process and enables the utilization of sine fitting algorithms.
Analogue to Digital Converter; Random Noise Test; Sine Wave
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Francisco André Corrêa Alegria. Random noise test of ADCs with a sinusoidal stimulus. World Journal of Advanced Engineering Technology and Sciences, 2023, 09(01), 220–227. Article DOI: https://doi.org/10.30574/wjaets.2023.9.1.0166