Random noise test of ADCs with a sinusoidal stimulus
Instituto Superior Técnico, Department of Electrical and Computer Engineering, University of Lisbon and Instituto de Telecomunicações, Av. Rovisco Pais, 11049-001 Lisbon, Portugal.
Review
World Journal of Advanced Engineering Technology and Sciences, 2023, 09(01), 220–227.
Article DOI: 10.30574/wjaets.2023.9.1.0166
Publication history:
Received on 20 April 2023; revised on 30 May 2023; accepted on 02 June 2023
Abstract:
The recommended random noise test for analogue to digital converters (ADCs), as stated in the IEEE 1057 Standard for Digitizing Waveform Recorders, suggests the utilization of a triangular signal as the stimulus for the ADC under examination. However, we will demonstrate that an alternative option of employing a sinusoidal stimulus signal is equally feasible. This substitution provides enhanced flexibility during the testing process and enables the utilization of sine fitting algorithms.
Keywords:
Analogue to Digital Converter; Random Noise Test; Sine Wave
Full text article in PDF:
Copyright information:
Copyright © 2023 Author(s) retain the copyright of this article. This article is published under the terms of the Creative Commons Attribution Liscense 4.0