Precision of the transfer function estimation of analog to digital converters in the presence of additive noise
Instituto de Telecomunicações and Instituto Superior Técnico, University of Lisbon, Portugal.
Review
World Journal of Advanced Engineering Technology and Sciences, 2023, 10(01), 136–146.
Article DOI: 10.30574/wjaets.2023.10.1.0266
Publication history:
Received on 15 August 2023; revised on 02 October 2023; accepted on 05 October 2023
Abstract:
Analog-to-digital converters are essential components in modern systems which gather data from the real world to be used, after signal processing, in many ubiquitous applications. This work addresses the effect of the presence of additive noise in the test setup when characterizing these electronic devices using the Histogram Test method. The precision with which the converter transfer function is estimated is directly related to the amount of noise present, the number of data samples acquired and the sinusoidal stimulus signal amplitude. Here an analytical expression that quantifies this precision as a function of the test parameters is given to be used by the engineer when designing the test.
Keywords:
Histogram test method; Analog-to-digital conversion; Noise; Precision
Full text article in PDF:
Copyright information:
Copyright © 2023 Author(s) retain the copyright of this article. This article is published under the terms of the Creative Commons Attribution Liscense 4.0